Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects
Wan‐Rong Geng, X.H. Tian, Yixiao Jiang, Yin‐Lian Zhu, Yun‐Long Tang, Yujia Wang, Min‐Jie Zou, Yuan Ping Feng, Boning Wu, Weichao Hu, Xiuliang Ma
Topics & Concepts
Materials scienceVacancy defectCondensed matter physicsFerroelectricityAnnealing (glass)Thin filmDomain wall (magnetism)Transmission electron microscopyNanotechnologyChemical physicsOptoelectronicsMagnetic fieldComposite materialChemistryPhysicsQuantum mechanicsDielectricMagnetizationMultiferroics and related materialsFerroelectric and Piezoelectric MaterialsDielectric properties of ceramics