Investigations into the negative sensitivity phenomenon in the detection of hidden defects using coplanar capacitive sensors
Martin Mwelango, Xiaokang Yin, Mingwei Zhao, Z. Zhang, Zhe Han, Ruirui Fan, Xin’an Yuan, Wei Li
Topics & Concepts
Capacitive sensingSensitivity (control systems)PhenomenonMaterials scienceElectronic engineeringPhysicsEngineeringElectrical engineeringQuantum mechanicsNon-Destructive Testing TechniquesUltrasonics and Acoustic Wave PropagationStructural Health Monitoring Techniques