Research on defect scanning and spatial locating based on CCIT sensor of single-pair electrode
Zhao Pan, Yu-Fu Chen, Shan Wang, Yintang Wen, Ruihang Li, Yuyan Zhang
Topics & Concepts
CapacitanceElectrodeImage sensorMaterials scienceSensitivity (control systems)Scanning capacitance microscopyOptoelectronicsElectronic engineeringOpticsComputer scienceArtificial intelligenceEngineeringScanning electron microscopePhysicsComposite materialQuantum mechanicsScanning confocal electron microscopyElectrical and Bioimpedance TomographyNon-Destructive Testing TechniquesAnalytical Chemistry and Sensors