Nanoscale measurement of adhesion forces and atomic-scale mechanisms at CSH/SiO2 and CSH/PVP-co-PAA interfaces
Gang Qiao, Yuyang Zhao, Pan Wang, Dongshuai Hou, Binmeng Chen
Topics & Concepts
Nanoscopic scaleMaterials scienceAdhesionNanotechnologyAtomic unitsAtomic force microscopyComposite materialChemical engineeringPhysicsEngineeringQuantum mechanicsForce Microscopy Techniques and ApplicationsAdvanced Surface Polishing TechniquesNear-Field Optical Microscopy