Quantum Metrology in the Noisy Intermediate‐Scale Quantum Era
Lin Jiao, Wei Wu, Si‐Yuan Bai, Jun‐Hong An
Abstract
Abstract Quantum metrology pursues the physical realization of higher‐precision measurements to physical quantities than the classically achievable limit by exploiting quantum features, such as entanglement and squeezing, as resources. It has potential applications in developing next‐generation frequency standards, magnetometers, radar, and navigation. However, the ubiquitous decoherence in the quantum world degrades the quantum resources and forces the precision back to or even worse than the classical limit, which is called the no‐go theorem of noisy quantum metrology and greatly hinders its applications. Therefore, how to realize the promised performance of quantum metrology in realistic noisy situations attracts much attention in recent years. The principle, categories, and applications of quantum metrology are reviewed. Special attention is paid to different quantum resources that can bring quantum superiority in enhancing sensitivity. Then, the no‐go theorem of noisy quantum metrology and its active control under different kinds of noise‐induced decoherence situations are introduced.