TOF-SIMS for carbon hybridization state analysis
М. Н. Дроздов, A.E. Ieshkin, Oleg A. Streletskiy, O. Yu. Nishchak, S.F. Belykh, А. Б. Толстогузов
Topics & Concepts
IonYield (engineering)SputteringCluster (spacecraft)Mass spectrumChemistryCarbon fibersSecondary ion mass spectrometryAnalytical Chemistry (journal)Spectral lineMass spectrometryHomogeneousChemical physicsMaterials scienceNanotechnologyThin filmPhysicsChromatographyOrganic chemistryAstronomyMetallurgyComposite numberComputer scienceThermodynamicsProgramming languageComposite materialIon-surface interactions and analysisDiamond and Carbon-based Materials ResearchMetal and Thin Film Mechanics