Litcius/Paper detail

AMMD: Attentive maximum mean discrepancy for few-shot image classification

Ji Wu, Shipeng Wang, Jian Sun

2024Pattern Recognition16 citationsDOI

Topics & Concepts

Shot (pellet)Artificial intelligencePattern recognition (psychology)Image (mathematics)MathematicsOne shotComputer scienceComputer visionEngineeringMechanical engineeringChemistryOrganic chemistryImage Processing Techniques and ApplicationsDomain Adaptation and Few-Shot LearningAdvanced Neural Network Applications
AMMD: Attentive maximum mean discrepancy for few-shot image classification | Litcius