A reliability study on automated defect assessment in optical pulsed thermography
Siyu Xiang, Akam M. Omer, Mingjun Li, Dazhi Yang, Ahmad Osman, Bingyang Han, Zhenze Gao, Hongbo Hu, Clemente Ibarra‐Castanedo, Xavier Maldague, Qiang Fang, Стефано Сфарра, Hai Zhang, Yu-Xia Duan
Topics & Concepts
ThermographyReliability (semiconductor)Nondestructive testingComputer scienceSegmentationImage processingArtificial intelligenceImage segmentationSIGNAL (programming language)Signal processingComputer visionReliability engineeringPattern recognition (psychology)Image (mathematics)Computer hardwareOpticsEngineeringDigital signal processingInfraredPower (physics)Programming languagePhysicsRadiologyQuantum mechanicsMedicineThermography and Photoacoustic TechniquesIndustrial Vision Systems and Defect DetectionAdvanced Sensor Technologies Research