Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio
Kousuke Ooe, Takehito Seki, Yuichi Ikuhara, Naoya Shibata
Topics & Concepts
DetectorOpticsScanning transmission electron microscopySIGNAL (programming language)USableSignal-to-noise ratio (imaging)Phase-contrast imagingMaterials sciencePhysicsComputer scienceTransmission electron microscopyPhase contrast microscopyProgramming languageWorld Wide WebAdvanced Electron Microscopy Techniques and ApplicationsAdvanced X-ray Imaging TechniquesAdvanced X-ray and CT Imaging