Analysis of admittance measurements of Al/Gr-PVA/p-Si (MPS) structure
Dilan Ata, Seçkin Altındal Yerişkin, A. Tataroğlu, Muzaffer Balbaşı
Topics & Concepts
CapacitanceConductanceAdmittanceAnalytical Chemistry (journal)Materials scienceEquivalent series resistanceChemistryElectrical engineeringCondensed matter physicsElectrical impedanceVoltageElectrodePhysicsChromatographyPhysical chemistryEngineeringSemiconductor materials and interfacesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis