Effects of oxygen vacancies on the photoexcited carrier lifetime in rutile TiO<sub>2</sub>
Lili Zhang, Weibin Chu, Qijing Zheng, Jin Zhao
Abstract
. Both the polaron and hybrid states exhibit strong electron-phonon (e-ph) coupling and their charge distributions become more and more delocalized when the temperature increases from 100 to 700 K. Such strong e-ph coupling and charge delocalization enhance the nonadibatic coupling between the electronic states along the hole relaxation path, where the defect states behave as intermediate states, leading to a distinct acceleration of e-h recombination. Our study provides valuable insights to understand the role of defects on photoexcited carrier lifetime in semiconductors.
Topics & Concepts
PolaronDelocalized electronCharge carrierSemiconductorMaterials scienceRutileElectronAtomic physicsBand gapAtom (system on chip)Carrier lifetimeCondensed matter physicsChemical physicsMolecular physicsChemistryOptoelectronicsPhysicsSiliconComputer scienceOrganic chemistryQuantum mechanicsEmbedded systemCopper-based nanomaterials and applicationsZnO doping and propertiesElectronic and Structural Properties of Oxides