Litcius/Paper detail

URLLC for Factory Automation: an Extensive Throughput-Reliability Analysis of D-MIMO.

Mario Alonzo, Paolo Baracca, Saeed R. Khosravirad, Stefano Buzzi

2020WSA12 citations

Topics & Concepts

AutomationThroughputReliability (semiconductor)Factory (object-oriented programming)Reliability engineeringComputer scienceManufacturing engineeringEngineeringTelecommunicationsMechanical engineeringWirelessPower (physics)Quantum mechanicsProgramming languagePhysicsDigital Transformation in IndustryFlexible and Reconfigurable Manufacturing SystemsVLSI and Analog Circuit Testing