Dielectric breakdown of oxide films in electronic devices
Andrea Padovani, Paolo La Torraca, Jack Strand, Luca Larcher, Alexander L. Shluger
Topics & Concepts
DielectricCapacitorDielectric strengthMaterials scienceReliability (semiconductor)Insulator (electricity)Engineering physicsElectrical breakdownOptoelectronicsElectrical engineeringVoltagePhysicsEngineeringThermodynamicsPower (physics)Semiconductor materials and devicesAdvanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices