Determining the effect of burn-in process on reliability of X7R multilayer ceramic capacitors
Pedram Yousefian, Clive A. Randall
Topics & Concepts
Materials scienceReliability (semiconductor)Ceramic capacitorThermal runawayCapacitorPopulationGrain boundaryElectrical engineeringReliability engineeringVoltageComposite materialEngineeringBattery (electricity)MicrostructureSociologyPower (physics)Quantum mechanicsPhysicsDemographyFerroelectric and Piezoelectric MaterialsMicrowave Dielectric Ceramics SynthesisSemiconductor materials and devices