Optical and electrical characterization of thin film MSP heterojunction based on organic material Al/p-Si/P3HT/Ag
S.E. Meftah, M. Benhaliliba, Murat Kaleli, C.E. Benouis, Celal Alp Yavru, A. Bayram
Topics & Concepts
Materials scienceHeterojunctionScanning electron microscopeChemical vapor depositionOptoelectronicsThin filmFabricationCharacterization (materials science)Layer (electronics)Equivalent series resistanceOrganic semiconductorDeposition (geology)Analytical Chemistry (journal)NanotechnologyComposite materialVoltageChemistryAlternative medicinePhysicsSedimentChromatographyPathologyBiologyQuantum mechanicsMedicinePaleontologySemiconductor materials and interfacesIntegrated Circuits and Semiconductor Failure AnalysisSemiconductor materials and devices