Real-time damage characterization for GFRCs using high-speed synchrotron X-ray phase contrast imaging
Jinling Gao, Nesredin Kedir, Cody Kirk, Julio A. Hernandez, Junyu Wang, Shane Paulson, Xuedong Zhai, Todd Horn, Garam Kim, Jian Gao, Kamel Fezzaa, Francesco De Carlo, Pavel Shevchenko, Tyler N. Tallman, Ronald Sterkenburg, Giuseppe R. Palmese, Weinong Chen
Topics & Concepts
Materials scienceSynchrotronComposite materialSynchrotron radiationImage resolutionPhase-contrast imagingBendingAdvanced Photon SourcePhase (matter)Characterization (materials science)OpticsBeam (structure)BeamlinePhase contrast microscopyPhysicsNanotechnologyQuantum mechanicsIntegrated Circuits and Semiconductor Failure AnalysisOptical measurement and interference techniquesAdvanced X-ray Imaging Techniques