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Image-based tool condition monitoring based on convolution neural network in turning process

Kou Rui, Shiwei Lian, Nan Xie, Beier Lu, Xuemei Liu

2022The International Journal of Advanced Manufacturing Technology39 citationsDOI

Topics & Concepts

Artificial neural networkArtificial intelligenceConvolutional neural networkComputer sciencePiecewiseConvolution (computer science)Pattern recognition (psychology)Computer visionMathematicsMathematical analysisAdvanced machining processes and optimizationAdvanced Machining and Optimization TechniquesIndustrial Vision Systems and Defect Detection
Image-based tool condition monitoring based on convolution neural network in turning process | Litcius