Recent advances on reliability of FPGAs in a radiation environment
Zhe Liu, Zukun Lu, Long Huang, Zhiwei Yao, Zhaojun Lu, Jiliang Zhang
Topics & Concepts
Static random-access memoryField-programmable gate arrayEmbedded systemTriple modular redundancyFault injectionFault toleranceContext (archaeology)EngineeringAerospaceRedundancy (engineering)Computer scienceComputer architectureReliability engineeringElectrical engineeringSoftwareOperating systemAerospace engineeringBiologyPaleontologyRadiation Effects in ElectronicsLow-power high-performance VLSI designVLSI and Analog Circuit Testing