Dislocation classification of a large-area β-Ga2O3 single crystal via contrast analysis of affine-transformed X-ray topographs
Yongzhao Yao, Yukari Ishikawa, Yoshihiro Sugawara
Topics & Concepts
DislocationContrast (vision)Burgers vectorAffine transformationDiffractionLine (geometry)X-rayGeometryCrystallographyTransformation (genetics)Projection (relational algebra)Materials sciencePlane (geometry)Diffraction topographySurface (topology)OpticsX-ray crystallographyPhysicsCondensed matter physicsMathematicsChemistryAlgorithmBiochemistryGeneGa2O3 and related materialsElectronic and Structural Properties of OxidesZnO doping and properties