A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov–Smirnov Test Method
Supriyo Srimani, Manas Kumar Parai, Kasturi Ghosh, Hafizur Rahaman
Topics & Concepts
Analogue electronicsFault detection and isolationComputer scienceSIGNAL (programming language)Filter (signal processing)Benchmark (surveying)Electronic engineeringFault (geology)Analogue filterField-programmable analog arrayElectronic circuitAnalog signalEngineeringArtificial intelligenceDigital filterAnalog multiplierDigital signal processingElectrical engineeringSeismologyGeologyComputer visionGeographyProgramming languageActuatorGeodesyVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Semiconductor Devices and Circuit Design