Methodology for the characterization and observation of filamentary spots in HfOx-based memristor devices
Samuel Poblador, Marcos Maestro-Izquierdo, M. Zabala, Mireia Bargalló González, F. Campabadal
Topics & Concepts
TinMaterials scienceElectrodeMemristorInsulator (electricity)Layer (electronics)OptoelectronicsResistive random-access memoryDielectricCharacterization (materials science)Degradation (telecommunications)Resistive touchscreenMicrostructureNanotechnologyComposite materialElectronic engineeringElectrical engineeringChemistryMetallurgyEngineeringPhysical chemistryAdvanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesNeuroscience and Neural Engineering