Degradation modeling and RUL prediction with Wiener process considering measurable and unobservable external impacts
Shuyi Zhang, Qingqing Zhai, Yaqiu Li
Topics & Concepts
UnobservableCovariateDegradation (telecommunications)Wiener processGamma processRandomnessProcess (computing)Stochastic processComputer scienceExponential functionVariogramEconometricsStatisticsKrigingMathematicsOperating systemMathematical analysisTelecommunicationsReliability and Maintenance OptimizationAdvanced Battery Technologies ResearchSoftware Reliability and Analysis Research