Reliability modeling of phased degradation under external shocks
Yixuan Geng, Shaoping Wang, Jian Shi, Yuwei Zhang, Weijie Wang
Topics & Concepts
Degradation (telecommunications)Limit (mathematics)Reliability (semiconductor)Shock (circulatory)Catastrophic failureReliability engineeringFailure mode and effects analysisComputer scienceTrajectoryMechanicsStructural engineeringControl theory (sociology)EngineeringPhysicsMathematicsThermodynamicsAstronomyArtificial intelligenceMedicineMathematical analysisTelecommunicationsPower (physics)Internal medicineControl (management)Reliability and Maintenance OptimizationFatigue and fracture mechanicsRisk and Safety Analysis