In depth analysis of transfer length method application on passivated contacts under illumination
Léo Basset, Wilfried Favre, Olivier Bonino, Julien Sudre, Gilles Ménard, Jean‐Pierre Vilcot
Topics & Concepts
PassivationMaterials scienceOptoelectronicsSolar cellFabricationSiliconVoltageBiasingCrystalline siliconOpticsElectrical engineeringNanotechnologyPhysicsAlternative medicineMedicineLayer (electronics)EngineeringPathologySilicon and Solar Cell TechnologiesIntegrated Circuits and Semiconductor Failure AnalysisSemiconductor materials and interfaces