An in-situ TEM characterization of electron beam induced dislocation motion in a single-crystalline gold thin film
Chi Xu, Wentuo Han, Wenbin Xue, Yongliang Li, Song Li, Bingsheng Li, Farong Wan
Topics & Concepts
DislocationMaterials scienceTransmission electron microscopyElectronDislocation creepOpticsCondensed matter physicsPhysicsNanotechnologyComposite materialQuantum mechanicsIon-surface interactions and analysisAdvanced Electron Microscopy Techniques and ApplicationsAdvanced Materials Characterization Techniques