Quantitative electric field mapping of a p–n junction by DPC STEM
S. Tōyama, Takehito Seki, Satoshi Anada, Hirokazu Sasaki, Kazuo Yamamoto, Yuichi Ikuhara, Naoya Shibata
Topics & Concepts
DeconvolutionOpticsDetectorScatteringScanning transmission electron microscopyPhysicsDark field microscopyInelastic scatteringPhase (matter)HolographyMaterials scienceElectric fieldMicroscopyTransmission electron microscopyQuantum mechanicsAdvanced Electron Microscopy Techniques and ApplicationsAdvanced X-ray Imaging TechniquesElectron and X-Ray Spectroscopy Techniques