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The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets

Yun Liu, Wei Wang, Haoyong Lu, Qiyun Xie, Limin Chen, Handi Yin, Guofeng Cheng, Xiaoshan Wu

2020Applied Surface Science26 citationsDOI

Topics & Concepts

Materials scienceAmorphous solidRaman spectroscopyLayer (electronics)van der Waals forceNanotechnologySurface roughnessChemical engineeringChemistryOpticsCrystallographyComposite materialMoleculeOrganic chemistryPhysicsEngineering2D Materials and ApplicationsPerovskite Materials and ApplicationsQuantum Dots Synthesis And Properties
The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets | Litcius