Litcius/Paper detail

Deep discriminative feature learning based on classification-enhanced neural networks for visual process monitoring

Wenjing Wang, Zhenhua Yu, Weichao Ding, Qingchao Jiang

2024Journal of the Taiwan Institute of Chemical Engineers11 citationsDOI

Topics & Concepts

Discriminative modelArtificial intelligenceComputer sciencePattern recognition (psychology)Feature (linguistics)Process (computing)Deep learningArtificial neural networkDeep neural networksMachine learningPhilosophyOperating systemLinguisticsFault Detection and Control SystemsIndustrial Vision Systems and Defect DetectionAdvanced Statistical Process Monitoring