Interface facilitated transformation of voids directly into stacking fault tetrahedra
X.F. Kong, Ning Gao, Irene J. Beyerlein, B.N. Yao, S.J. Zheng, Xiumin Ma, Dominik Legut, Timothy C. Germann, H.J. Zhang, Ruifeng Zhang
Topics & Concepts
Materials scienceStacking faultNucleationDislocationFacetingTransmission electron microscopyCondensed matter physicsCrystallographyPartial dislocationsCrystallographic defectChemical physicsComposite materialNanotechnologyThermodynamicsChemistryPhysicsNuclear materials and radiation effectsFusion materials and technologiesIon-surface interactions and analysis