Automatic crack tip localization in enormous DIC images to in-situ characterize high-temperature fatigue crack growth behavior
Chen Zhang, Mengqi Lei, Yuanxin Chen, Kuang Bin, Shijie Liu, Yanhuai Ding, Qihong Fang, Xiaotian Li, Wei He, Huimin Xie
Topics & Concepts
In situParis' lawMaterials scienceComposite materialCrack closureStructural engineeringFracture mechanicsEngineeringChemistryOrganic chemistryNon-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure AnalysisFatigue and fracture mechanics