SHREC 2020: Classification in cryo-electron tomograms
Ilja Gubins, Marten L. Chaillet, Gijs van der Schot, Remco C. Veltkamp, Friedrich Förster, Yu Hao, Xiaohua Wan, Xuefeng Cui, Fa Zhang, Emmanuel Moebel, Xiao Wang, Daisuke Kihara, Xiangrui Zeng, Min Xu, Nguyen Nguyen, Tommi White, Filiz Bunyak
Topics & Concepts
Cryo-electron tomographyBenchmark (surveying)Computer scienceElectron tomographyContext (archaeology)Artificial intelligenceConvolutional neural networkPattern recognition (psychology)TomographyResolution (logic)Matching (statistics)Machine learningPhysicsMathematicsOpticsStatisticsBiologyElectron microscopeScanning transmission electron microscopyGeographyPaleontologyGeodesyAdvanced Electron Microscopy Techniques and ApplicationsComputational Physics and Python ApplicationsCell Image Analysis Techniques