Study on proton-induced single event effect of SiC diode and MOSFET
Hong Zhang, Hongxia Guo, Fengqi Zhang, Zhi-feng Lei, Xiaoyu Pan, Yitian Liu, Zhao-Qiao Gu, An-An Ju, Xiangli Zhong, Xiaoping Ouyang
Topics & Concepts
Materials scienceMOSFETDiodeOptoelectronicsVoltageBreakdown voltageFluenceProtonIrradiationElectrical engineeringPhysicsTransistorNuclear physicsEngineeringRadiation Effects in ElectronicsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devices