Reliability assessment of PEMFC aging prediction based on probabilistic Bayesian mixed recurrent neural networks
Yanjun Liu, Hao Li, Yang Yang, Wenchao Zhu, Changjun Xie, Xiaoran Yu, Bingxin Guo
Topics & Concepts
Reliability (semiconductor)Probabilistic logicArtificial neural networkBayesian probabilityReliability engineeringComputer scienceBayesian networkDynamic Bayesian networkArtificial intelligenceMachine learningEngineeringPhysicsPower (physics)Quantum mechanicsFuel Cells and Related MaterialsAnalytical Chemistry and SensorsFault Detection and Control Systems