Low-voltage series arc fault detection based on ECMC and VB-SCN
Jinjie Li, Guofeng Zou, Wei Wang, Nan Shao, Bangzheng Han, Liangyu Wei
Topics & Concepts
Robustness (evolution)Computer scienceAlgorithmPattern recognition (psychology)Feature selectionFault detection and isolationArtificial intelligenceData miningActuatorChemistryGeneBiochemistryElectrical Fault Detection and ProtectionIntegrated Circuits and Semiconductor Failure AnalysisOccupational Health and Safety Research