Integration for degradation analysis with multi-source ADT datasets considering dataset discrepancies and epistemic uncertainties
Wenbin Chen, Xiaoyang Li, Rui Kang
Topics & Concepts
Degradation (telecommunications)Reliability (semiconductor)Computer scienceData miningProcess (computing)Uncertainty analysisUncertainty quantificationReliability engineeringStatisticsMachine learningMathematicsEngineeringSimulationTelecommunicationsQuantum mechanicsPower (physics)Operating systemPhysicsReliability and Maintenance OptimizationPower System Reliability and MaintenanceStatistical Distribution Estimation and Applications