Reliability analysis of dopingless vertical nanowire TFET with interface trap charges for ring-oscillator circuit implementation
Anjana Bhardwaj, Amit Das, Ranjeeta Yadav, Pradeep Kumar
Topics & Concepts
Trap (plumbing)Ring oscillatorReliability (semiconductor)Ring (chemistry)Interface (matter)NanowireOptoelectronicsElectrical engineeringComputer scienceMaterials scienceElectronic engineeringReliability engineeringPhysicsEngineeringChemistryQuantum mechanicsMoleculePower (physics)MeteorologyCMOSOrganic chemistryGibbs isothermAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesFerroelectric and Negative Capacitance Devices