Application of atomic force microscopy in adhesion force measurements
Sedigheh Sadegh Hassani, Maryam Daraee, Zahra Sobat
Abstract
The adhesion force between the surfaces and various compounds is a fundamental feature that causes formation and modification of compounds and can be used to various applications. Adhesion force performs in several main ways that recognition and monitoring of this force would be very useful in the material study. Atomic force microscope (AFM) is a modern precisionist device which has been able to examine and closely monitor the adhesion force at the nanometer scale. The interaction forces between AFM tip and sample surface are considered to investigate the adhesion force. It can be applied to wide ranges of materials which are important in current modern industries such as pharmaceutical compounds, polymers, nanomaterials, and semiconductors.