Forward bias capacitance investigation as a powerful tool to monitor graphene/silicon interfaces
Ilaria Matacena, Pierluigi Guerriero, L. Lancellotti, E. Bobeico, Nicola Lisi, Rosa Chierchia, Paola Delli Veneri, Santolo Daliento
Topics & Concepts
CapacitanceMaterials scienceInterface (matter)SiliconOptoelectronicsDopingGrapheneBiasingSolar cellSchottky barrierVoltageSchottky diodeNanotechnologyElectrodeElectrical engineeringPhysicsComposite materialDiodeCapillary numberEngineeringCapillary actionQuantum mechanicsGraphene research and applicationsSemiconductor materials and interfacesSilicon Nanostructures and Photoluminescence