Quantitative measurement of nanofriction between PMMA thin films and various AFM probes
Hubert Grzywacz, Michał Milczarek, Piotr Jenczyk, Wojciech Dera, Marcin Michałowski, Dariusz M. Jarząbek
Topics & Concepts
CantileverMaterials scienceNanoscopic scaleAtomic force microscopyRADIUSThin filmComposite materialDiamond-like carbonSiliconFriction coefficientNanotechnologyOptoelectronicsComputer securityComputer scienceForce Microscopy Techniques and ApplicationsAdhesion, Friction, and Surface InteractionsMechanical and Optical Resonators