Dynamically corrected gates suppressing spatiotemporal error correlations as measured by randomized benchmarking
C. L. Edmunds, C. Hempel, R. J. Harris, V. Frey, T. M. Stace, M. J. Biercuk
Abstract
This work introduces a method to measure error correlations in quantum circuits, both temporally between gates and spatially between qubits. The authors demonstrate that using appropriately tailored dynamically corrected gates can not only reduce the likelihood of errors, but also correlations between them, and can hence be used to precondition a circuit for quantum error correction.
Topics & Concepts
Measure (data warehouse)Computer sciencePreconditionAlgorithmError detection and correctionWork (physics)QuantumBenchmarkingQuantum error correctionQuantum circuitLogic gateMathematicsQuantum gateElectronic engineeringQuantum algorithmObservational errorError analysisQuantum Computing Algorithms and ArchitectureRadiation Effects in ElectronicsQuantum Information and Cryptography