Local–global lightweight ViT model for mini/micro-LED-chip defect recognition
Linyu Wei, Jueping Cai, Kailin Wen, Chengkai Zhang
Topics & Concepts
Computer scienceConvolutional neural networkMobile deviceChipDeep learningConvolution (computer science)Block (permutation group theory)Artificial neural networkArtificial intelligenceComputer engineeringTelecommunicationsOperating systemGeometryMathematicsIndustrial Vision Systems and Defect DetectionCCD and CMOS Imaging SensorsThin-Film Transistor Technologies