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HfO2/SiO2 anti-reflection films for UV lasers via plasma-enhanced atomic layer deposition

Chaoyi Yin, Meiping Zhu, Tingting Zeng, Chen Song, Yingjie Chai, Yuchuan Shao, Rongjun Zhang, Jiaoling Zhao, Dawei Li, Jianda Shao

2020Journal of Alloys and Compounds23 citationsDOI

Topics & Concepts

Atomic layer depositionMaterials scienceLaserPlasmaDeposition (geology)UltravioletLayer (electronics)Reflection (computer programming)OptoelectronicsThin filmAbsorption (acoustics)IrradiationOpticsNanotechnologyComposite materialPhysicsSedimentPaleontologyQuantum mechanicsNuclear physicsBiologyComputer scienceProgramming languageSemiconductor materials and devicesDiamond and Carbon-based Materials ResearchElectronic and Structural Properties of Oxides
HfO2/SiO2 anti-reflection films for UV lasers via plasma-enhanced atomic layer deposition | Litcius