Fruit Defect Prediction Model (FDPM) based on Three-Level Validation
Yogesh Yogesh, Ashwani Kumar Dubey, Rajeev Ratan, Ashish Mathur
Topics & Concepts
ThermographyRGB color modelArtificial intelligenceNondestructive testingThermalInfraredMaterials scienceComputer scienceBiological systemNaive Bayes classifierOpticsComputer visionPattern recognition (psychology)Support vector machinePhysicsQuantum mechanicsMeteorologyBiologySpectroscopy and Chemometric AnalysesDate Palm Research StudiesAdvanced Chemical Sensor Technologies