Effect of the lattice mismatch on threading dislocations in heteroepitaxial GaN layers revealed by X-ray diffraction
Cosmin Romanițan, Iuliana Mihalache, Oana Tutunaru, Cristina Pachiu
Topics & Concepts
Materials scienceDiffractionDislocationCondensed matter physicsPhotoluminescenceScatteringCrystallographyMolecular physicsAbsorption edgeX-ray crystallographyOpticsBand gapOptoelectronicsChemistryPhysicsComposite materialGaN-based semiconductor devices and materialsGa2O3 and related materialsMetal and Thin Film Mechanics