A degradation modeling and reliability estimation method based on Wiener process and evidential variable
Di Liu, Shaoping Wang
Topics & Concepts
Reliability (semiconductor)Evidential reasoning approachWiener processVariable (mathematics)Random variableBayesian probabilityPopulationProcess (computing)Computer scienceData miningMathematicsArtificial intelligenceStatisticsDecision support systemSociologyPower (physics)Operating systemQuantum mechanicsBusiness decision mappingPhysicsDemographyMathematical analysisReliability and Maintenance OptimizationRisk and Safety AnalysisStatistical Distribution Estimation and Applications