An efficient radiation hardening SRAM cell to mitigate single and double node upset soft errors
Mukku Pavan Kumar, Rohit Lorenzo
Topics & Concepts
UpsetStatic random-access memorySoft errorNode (physics)Memory cellSingle event upsetComputer scienceRadiationHeavy ionParallel computingPhysicsIonComputer hardwareElectronic engineeringNuclear physicsTransistorMathematicsVoltageEngineeringStatisticsQuantum mechanicsRadiation Effects in ElectronicsSemiconductor materials and devicesAdvanced Memory and Neural Computing