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Power cycling tests under driving ΔTj = 125 °C on the Cu clip bonded EV power module

Dongjin Kim, Byeongsoo Lee, Tae‐Ik Lee, Seungjun Noh, Chanyang Choe, Se Min Park, Minsu Kim

2022Microelectronics Reliability25 citationsDOI

Topics & Concepts

Materials scienceTemperature cyclingMolding (decorative)Scanning electron microscopeMicrostructureComposite materialThermal resistancePower (physics)Junction temperatureFinite element methodPower densityThermalElectrical engineeringAutomotive engineeringStructural engineeringEngineeringMeteorologyQuantum mechanicsPhysicsElectronic Packaging and Soldering TechnologiesSilicon Carbide Semiconductor TechnologiesElectromagnetic Compatibility and Noise Suppression
Power cycling tests under driving ΔTj = 125 °C on the Cu clip bonded EV power module | Litcius