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Multi-layer parallel transformer model for detecting product quality issues and locating anomalies based on multiple time‑series process data in Industry 4.0

Jiewu Leng, Zisheng Lin, Man Zhou, Qiang Liu, Pai Zheng, Zhihong Liu, Xin Chen

2023Journal of Manufacturing Systems25 citationsDOI

Topics & Concepts

Anomaly detectionComputer scienceSecurity tokenReal-time computingEngineeringData miningComputer securityIndustrial Vision Systems and Defect DetectionDigital Transformation in IndustryAnomaly Detection Techniques and Applications
Multi-layer parallel transformer model for detecting product quality issues and locating anomalies based on multiple time‑series process data in Industry 4.0 | Litcius