Litcius/Paper detail

Supervised contrastive learning for wafer map pattern classification

Youngjae Bae, Seokho Kang

2023Engineering Applications of Artificial Intelligence31 citationsDOI

Topics & Concepts

Computer scienceWaferArtificial intelligenceConvolutional neural networkPattern recognition (psychology)Benchmark (surveying)Deep learningFunction (biology)Materials scienceGeographyNanotechnologyGeodesyEvolutionary biologyBiologyIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques
Supervised contrastive learning for wafer map pattern classification | Litcius