Phase measuring profilometry based on binary grating projection for fringe order self-extraction
Jingsong Chen, Yiping Cao, Haitao Wu
Topics & Concepts
ProjectorOpticsGratingStructured-light 3D scannerPhase (matter)ProfilometerProjection (relational algebra)Binary numberStructured lightComputer scienceMaterials scienceAlgorithmPhysicsSurface finishMathematicsArithmeticScannerComposite materialQuantum mechanicsOptical measurement and interference techniquesOptical Systems and Laser TechnologyAdvanced Measurement and Detection Methods